Our systems with high detection sensitivity and high resolving power, are based on an active principle that combines a terahertz emission source and a terahertz signal measuring sensor. The emitted wave propagates inside the material and is then captured by the sensor measuring its amplitude, its phase and polarisation ; these three variables provide information on the internal properties of the material crossed.
Several analysis methods can be envisaged, mainly transmission and 0°/45° reflection.
Materials/Manufacturing processes analysis :
- Understanding of new materials and their performances
- Development of manufacturing processes by analysis the inner properties of materials
- Quantification of inner parameters for the development of numerical models